IEC 62047-11:2013 ED1

Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems IEC 62047-11:2013 ED1

Publication date:   Jul 17, 2013

General information

60.60 Standard published   Jul 17, 2013


TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices



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IEC 62047-11:2013 specifies the test method to measure the linear thermal expansion coefficients (CLTE) of thin free-standing solid (metallic, ceramic, polymeric, etc.) micro-electro-mechanical system (MEMS) materials with length between 0,1 mm and 1 mm and width between 10 micrometre and 1 mm and thickness between 0,1 micrometre and 1 mm, which are main structural materials used for MEMS, micromachines and others. This test method is applicable for the CLTE measurement in the temperature range from room temperature to 30 % of a material's melting temperature.

Life cycle


IEC 62047-11:2013 ED1
60.60 Standard published
Jul 17, 2013