IEC 60747-14-1:2010 ED2

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors IEC 60747-14-1:2010 ED2

Publication date:   Jan 21, 2010

General information

60.60 Standard published   Jan 21, 2010


TC 47/SC 47E

International Standard

31.080.01   Semiconductor devices in general



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IEC 60747-14-1:2009 describes general items concerning the specifications for sensors, which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductor, for example dielectric and ferroelectric materials. The major changes with regard to the previous edition are as follows: a) Title change from "Semiconductor sensors - General and classification" to "Semiconductor sensors - Generic specification for sensors"; b) Clause 3 has been divided into three Clauses 3, 4 and 5; c) Added new terms from IEC 60747-14-5; d) Added a new Clause relating to Quality assessment procedures; e) Added a Bibliography; f) Added a new Annex for the sampling procedure.

Life cycle


IEC 60747-14-1:2000 ED1


IEC 60747-14-1:2010 ED2
60.60 Standard published
Jan 21, 2010