IEC 60749-13:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere IEC 60749-13:2002 ED1

Publication date:   Apr 12, 2002

Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.