IEC 60749-13:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Publication date:   Apr 12, 2002

General information

99.60 Withdrawal effective   Feb 15, 2018

WPUB   

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

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Revised

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Scope

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

PREVIOUSLY

Replaces
IEC PAS 62183:2000 ED1

NOW

WITHDRAWN
IEC 60749-13:2002 ED1
99.60 Withdrawal effective
Feb 15, 2018

CORRIGENDA / AMENDMENTS

Corrected by
IEC 60749-13:2002/COR1:2003 ED1

REVISED BY

PUBLISHED
IEC 60749-13:2018 ED2