IEC 60749-4:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) IEC 60749-4:2002 ED1

Publication date:   Apr 12, 2002

Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

The contents of the corrigendum of August 2003 have been included in this copy.