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Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
60.60 Standard published
Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
60.60 Standard published
Waveguide type dielectric resonators - Part 4-1: Blank detail specification
60.60 Standard published
Waveguide type dielectric resonators - Part 4: Sectional specification
60.60 Standard published
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
60.60 Standard published
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
60.60 Standard published
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
60.60 Standard published
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
60.60 Standard published
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
60.60 Standard published
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
60.60 Standard published
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
60.60 Standard published
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
60.60 Standard published
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
60.60 Standard published
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
60.60 Standard published
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
60.60 Standard published
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
60.60 Standard published
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
60.60 Standard published
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
60.60 Standard published
