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EN 62276:2016

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods EN 62276:2016

Publication date:   Apr 18, 2017

General information

60.60 Standard published   Dec 9, 2016

CENELEC

CLC/SR 49 Piezoelectric and dielectric devices for frequency control and selection

European Norm

31.140   Piezoelectric devices

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Scope

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 62276:2013

NOW

PUBLISHED
EN 62276:2016
60.60 Standard published
Dec 9, 2016

REVISED BY

IN_DEVELOPMENT
prEN IEC 62276:2024