Standards search

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Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-22: Graphene-based material - Ash content: Incineration

60.60 Standard published

TC 113

IEC TS 62607-6-27 Nanomanufacturing - Key control characteristics-– Part 06-27: Two-dimensional materials - Field-effect mobility: 4-Point Probe Field-Effect Transistor method

40.99 Full report circulated: DIS approved for registration as FDIS

TC 113

Nanomanufacturing - Key control characteristics - Part 6-29: Graphene-based materials - Defectiveness: Raman spectroscopy

30.60 Close of voting/ comment period

TC 113

Nanomanufacturing - Key control characteristics - Part 6-30: Graphene-based material - Anion concentration: Ion chromatography method

50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks

TC 113

Nanomanufacturing - Key control characteristics - Part 6-3: Graphene-based material - Domain size: substrate oxidation

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Surface conductance: non-contact microwave resonant cavity method

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-5: Graphene-based materials - Contact and sheet resistance: transmission line measurement

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-7: Graphene - Sheet resistance: van der Pauw method

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-8: Graphene - Sheet resistance: In-line four-point probe

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-9: Graphene-based material - Sheet resistance: Eddy current method

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 7-2: Nano-enabled photovoltaics - Device evaluation method for indoor light

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices - Analogue resistance change and resistance fluctuation: Electrical resistance measurement

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Nanomagnetic products - Magnetic field distribution: Magneto-optical indicator film technique

60.00 Standard under publication

TC 113