Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.
Nanomanufacturing - Key control characteristics - Part 4-7: Nano-enabled electrical energy storage - Determination of magnetic impurities in anode nanomaterials, ICP-OES method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 4-8: Nano-enabled electrical energy storage - Determination of water content in electrode nanomaterials, Karl Fischer method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 5-4: Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS)
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-10: Graphene-based material - Sheet resistance: Terahertz time-domain spectroscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-1: Graphene-based material - Volume resistivity: four probe method
60.60 Standard published
Nanomanufacturing - Key Control Characteristics - Part 6-12: Graphene - Number of layers: Raman spectroscopy, optical reflection
60.00 Standard under publication
Corrigendum 1 - Nanomanufacturing - Key control characteristics - Part 6-13: Graphene powder - Oxygen functional group content: Boehm titration method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-13: Graphene powder - Oxygen functional group content: Boehm titration method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-14: Graphene-based material - Defect level: Raman spectroscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-16: Two-dimensional materials - Carrier concentration: Field effect transistor method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-18: Graphene-based material - Functional groups: TGA-FTIR
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyser, ONH analyser
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material - Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
60.60 Standard published
