IEC TS 62607-6-20:2022 ED1

Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry IEC TS 62607-6-20:2022 ED1

Publication date:   Oct 11, 2022

General information

60.60 Standard published   Oct 11, 2022


TC 113

Technical Specification

07.120   Nanotechnologies



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IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic
- metallic impurity content
for powders of graphene-based materials by
- inductively coupled plasma mass spectrometry (ICP-MS).
The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS.
- The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO).
– The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.

Life cycle


IEC TS 62607-6-20:2022 ED1
60.60 Standard published
Oct 11, 2022