Standards search

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Determination of water — Karl Fischer method (General method)

90.93 Standard confirmed

ISO/TC 47

Chemistry — Layouts for standards — Part 2: Methods of chemical analysis

90.93 Standard confirmed

ISO/TC 47

Chemical products for industrial use — Sampling techniques — Solid chemical products in the form of particles varying from powders to coarse lumps

90.93 Standard confirmed

ISO/TC 47

Volatile organic liquids for industrial use — Determination of distillation characteristics

90.93 Standard confirmed

ISO/TC 47

Surface chemical analysis — X-ray photoelectron spectroscopy — Repeatability and constancy of intensity scale

30.60 Close of voting/ comment period

ISO/TC 201/SC 7

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds

30.99 CD approved for registration as DIS

ISO/TC 201/SC 7

Gas analysis — Conversion of gas mixture composition data

40.93 Full report circulated: decision for new DIS ballot

ISO/TC 158

Surface chemical analysis — Total reflection X-ray fluorescence analysis of water

40.00 DIS registered

ISO/TC 201/SC 10

Surface chemical analysis — Sample handling, preparation and mounting — Part 2: Documenting and reporting the preparation and mounting of specimens for analysis

40.20 DIS ballot initiated: 12 weeks

ISO/TC 201/SC 2

Gas analysis — Comparison methods for determining and checking the composition of calibration gas mixtures

40.60 Close of voting

ISO/TC 158

Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis

50.00 Final text received or FDIS registered for formal approval

ISO/TC 201/SC 2

Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis

50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks

ISO/TC 201/SC 7

Surface chemical analysis — Characterization of nanostructured materials

60.60 Standard published

ISO/TC 201/SC 7

Surface chemical analysis — Depth profiling — Measurement of sputtered depth

60.60 Standard published

ISO/TC 201/SC 4

Surface chemical analysis — Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation

60.60 Standard published

ISO/TC 201/SC 2

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds

90.92 Standard to be revised

ISO/TC 201/SC 7

Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information

60.60 Standard published

ISO/TC 201/SC 7

Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods

60.60 Standard published

ISO/TC 201/SC 2