Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
60.60 Standard published
Photography — Projection in indoor rooms — Part 1: Screen illumination test for still projectors
90.93 Standard confirmed
Paper and board — Determination of CIE whiteness, C/2° (indoor illumination conditions)
90.93 Standard confirmed
Microscopes — Definition and measurement of illumination properties — Part 1: Image brightness and uniformity in bright field microscopy
90.93 Standard confirmed
Microscopes — Definition and measurement of illumination properties — Part 2: Illumination properties related to the colour in bright field microscopy
90.60 Close of review
Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
60.60 Standard published
Paper and board — Determination of colour by diffuse reflectance — Part 3: Indoor illumination conditions (D50/2°)
60.60 Standard published
