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PNW 47-2886 ED1

Semiconductor devices - semiconductor devices for IOT system - part 2: test method of semiconductor photon sources incorporating human factors for wearable equipment

General information

10.20 New project ballot initiated   Oct 25, 2024

PRVN    Jan 17, 2025

IEC

TC 47

International Standard

Life cycle

NOW

IN_DEVELOPMENT
PNW 47-2886 ED1
10.20 New project ballot initiated
Oct 25, 2024