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prEN IEC 63378-6-1:2025

Thermal standardization on semiconductor packages - Part 6-1: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points - Model creation method using a datasheet of semiconductor device prEN IEC 63378-6-1:2025

Publication date:   Sep 19, 2025

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40.60   Close of voting   Dec 12, 2025

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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prEN IEC 63378-6-1:2025
40.60 Close of voting
Dec 12, 2025




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