prEN IEC 60749-34-1:2023

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module

Publication date:   Dec 22, 2023

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40.60 Close of voting   Mar 15, 2024

CENELEC

CLC/TC 47X

European Norm

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prEN IEC 60749-34-1:2023
40.60 Close of voting
Mar 15, 2024