prEN IEC 60749-29:2026

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test prEN IEC 60749-29:2026

Publication date:   Jan 30, 2026

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40.60   Close of voting   Apr 24, 2026

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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prEN IEC 60749-29:2026
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