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PNW 47F-430 ED1

Semiconductor devices - Micro-electromechanical devices - Part 49: Reliability test methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

General information

10.98   New project rejected   Jul 7, 2023

IEC

TC 47/SC 47F

International Standard

Life cycle

NOW

ABANDON
PNW 47F-430 ED1
10.98 New project rejected
Jul 7, 2023