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PNW 47f-4 ED1

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Future IEC 62047-10) PNW 47f-4 ED1

General information

10.98 New project rejected   Jun 26, 2009

IEC

TC 47/SC 47F

International Standard

Life cycle

NOW

ABANDON
PNW 47f-4 ED1
10.98 New project rejected
Jun 26, 2009