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PNW 47F-39 ED1

(Future IEC 62047-16): Semiconductor devices -Micro-electromechanical devices - Part 16: Test method forresidual stress measurement

General information

10.98   New project rejected   Mar 12, 2010

IEC

TC 47/SC 47F

International Standard

Life cycle

NOW

ABANDON
PNW 47F-39 ED1
10.98 New project rejected
Mar 12, 2010