PNW 47F-38 ED1

(Future IEC 62047-15): Semiconductor devices -Micro-electromechanical devices - Part 15: Test method for bond strength in PDMS/Glass chip PNW 47F-38 ED1

General information

10.98 New project rejected   Mar 12, 2010

IEC

TC 47/SC 47F

International Standard

Life cycle

NOW

ABANDON
PNW 47F-38 ED1
10.98 New project rejected
Mar 12, 2010