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PNW 47E-526 ED1

Future IEC 60747-14-10: Semiconductor devices - Part 14-10: Semiconductor sensors - Test and evaluation methods for implantable glucose sensor PNW 47E-526 ED1

General information

10.98 New project rejected   Mar 25, 2016

IEC

TC 47/SC 47E

International Standard

Life cycle

NOW

ABANDON
PNW 47E-526 ED1
10.98 New project rejected
Mar 25, 2016