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ISO/WD 29222

Standards for thickness measurement of thin films by TEM-EELS and STEM-EDS analytical electron microscopy at the nanometer and sub-nanometer level ISO/WD 29222

General information

20.98   Project deleted   Sep 9, 2008

ISO

ISO/TC 202/SC 3 Analytical electron microscopy

International Standard

71.040.99   Other standards related to analytical chemistry

Life cycle

NOW

ABANDON
ISO/WD 29222
20.98 Project deleted
Sep 9, 2008




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