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ISO/WD 22985

ISO/WD 22985

Surface chemical analysis — X-ray photoelectron spectroscopy — Non-destructive depth-profiling analysis of thin films by Angle resolved XPS

General information

Current stage: 20.98 Project deleted May 29, 2006

Originator: ISO

Owner: ISO/TC 201/SC 7 Electron spectroscopies

Type: International Standard

ICS: 71.040.40 Chemical analysis

Life cycle

NOW

ABANDON
ISO/WD 22985
20.98 Project deleted
May 29, 2006