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ISO/NP 5410

Surface chemical analysis — Electron Spectroscopies — Thickness measurement of nm oxide films by mutual calibration of zero offset method and length-unit traceable method

General information

10.98   New project rejected   Aug 26, 2020

ISO

ISO/TC 201/SC 7 Electron spectroscopies

International Standard

Life cycle

NOW

ABANDON
ISO/NP 5410
10.98 New project rejected
Aug 26, 2020