ISO/NP 5410

Surface chemical analysis — Electron Spectroscopies — Thickness measurement of nm oxide films by mutual calibration of zero offset method and length-unit traceable method ISO/NP 5410

Current stage: 10.98 New project rejected Aug 26, 2020

Originator: ISO

Owner: ISO/TC 201/SC 7 Electron spectroscopies

Type: International Standard

ABANDON
ISO/NP 5410
10.98 New project rejected
Aug 26, 2020

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