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ISO/NP 16658

Surface chemical analysis — Chemical preparation methods to collect analyte elements of working reference material of silicon wafers for total reflection X-ray fluorescence spectroscopy (TXRF) ISO/NP 16658

General information

10.98   New project rejected   Nov 25, 1998

ISO

ISO/TC 201 Surface chemical analysis

International Standard

Life cycle

NOW

ABANDON
ISO/NP 16658
10.98 New project rejected
Nov 25, 1998




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