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Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
90.60 Close of review
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
90.60 Close of review
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy — Amendment 1
60.60 Standard published
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
90.60 Close of review
Surface chemical analysis — Surface characterization — Measurement of the lateral resolution of a confocal fluorescence microscope
90.93 Standard confirmed
Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
90.93 Standard confirmed
Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
60.60 Standard published
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
60.60 Standard published
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
60.60 Standard published
Surface chemical analysis — Surface chemical analysis of bacteria and biofilms
60.60 Standard published
Surface chemical analysis — Sample handling, preparation and mounting — Part 5: Specimen taking, storage, and transport of biological specimens
40.00 DIS registered
