Main menu
Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.
Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
90.93 Standard confirmed
Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
60.60 Standard published
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
90.93 Standard confirmed
Surface chemical analysis — Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy — Amendment 1
60.60 Standard published
Surface chemical analysis — Surface characterization — Measurement of the lateral resolution of a confocal fluorescence microscope
90.93 Standard confirmed
Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope
60.60 Standard published
Surface chemical analysis — Determination of the minimum detectability of surface plasmon resonance device
60.60 Standard published
SCA –Surface chemical analysis of bacteria and biofilms
20.00 New project registered in TC/SC work programme
Surface chemical analysis — Characterization of functional glass substrates for biosensing applications
60.60 Standard published
Surface chemical analysis — Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
90.93 Standard confirmed