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ISO/IEC AWI 25447

Face image profile for less constrained capture conditions ISO/IEC AWI 25447

General information

20.00 New project registered in TC/SC work programme   Nov 25, 2024

ISO/IEC

ISO/IEC JTC 1/SC 37 Biometrics

International Standard

Scope

Requirements, recommendations, and best practices in face data acquisition for less constraint applications.

Life cycle

NOW

IN_DEVELOPMENT
ISO/IEC AWI 25447
20.00 New project registered in TC/SC work programme
Nov 25, 2024