ISO/CD 13139

Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals ISO/CD 13139

Scope

This document specifies procedures for the measurement of dislocation density in thin metals by using transmission electron microscope. This document applies to measure the dislocation density lower than 11015m-2. This document applies to analyse the dislocations in a single grain of the thin metals’ specimen with the thickness between tens to hundreds of nanometers.