20.00 New project registered in TC/SC work programme Jul 6, 2022
ISO
ISO/TC 229 Nanotechnologies
Technical Specification
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.
IN_DEVELOPMENT
ISO/AWI TS 23879
20.00
New project registered in TC/SC work programme
Jul 6, 2022