ISO/AWI 20171

Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electronmicroscopy (TIFF/SEM)

General information

Current stage: 20.00 New project registered in TC/SC work programme Jan 5, 2026

Originator: ISO

Owner: ISO/TC 202/SC 4 Scanning electron microscopy

Type: International Standard

Scope

This document specifies a platform-independent data file format for digital images generated by a
scanning electron microscope (SEM) by adapting the TIFF based format.

Life cycle

NOW

IN_DEVELOPMENT
ISO/AWI 20171
20.00 New project registered in TC/SC work programme
Jan 5, 2026