ISO/AWI 12179

Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments ISO/AWI 12179

Scope

This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.