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ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

Publication date:   Nov 16, 2005

General information

90.93   Standard confirmed   Mar 13, 2025

ISO

ISO/TC 206 Fine ceramics

International Standard

81.060.30   Advanced ceramics

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Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

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PUBLISHED
ISO 18452:2005
90.93 Standard confirmed
Mar 13, 2025