0

ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer ISO 18452:2005

Publication date:   Nov 16, 2005

General information

90.93   Standard confirmed   Mar 13, 2025

ISO

ISO/TC 206 Fine ceramics

International Standard

81.060.30   Advanced ceramics

Buying

Published

Language in which you want to receive the document.

Scope

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Life cycle

NOW

PUBLISHED
ISO 18452:2005
90.93 Standard confirmed
Mar 13, 2025




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version