ISO 18118:2004/NP Amd 1

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials — Amendment 1

Current stage: 10.98 New project rejected Apr 3, 2014

Originator: ISO

Owner: ISO/TC 201/SC 7 Electron spectroscopies

Type: International Standard

ICS: 71.040.40 Chemical analysis

ABANDON
ISO 18118:2004/NP Amd 1
10.98 New project rejected
Apr 3, 2014