90.93 Standard confirmed Nov 27, 2020
ISO
ISO/TC 172/SC 9 Laser and electro-optical systems
International Standard
31.260 Optoelectronics. Laser equipment | 01.040.31 Electronics (Vocabularies)
ISO 15367-1:2003 specifies methods for the measurement of the topography of the wavefront of a laser beam by measurement and interpretation of the spatial distribution of the phase of that wavefront across a plane approximately perpendicular to its direction of propagation. Requirements are given for the measurement and analysis of phase distribution data to provide quantitative wavefront parameters and their uncertainty in a test report.
The methods described in ISO 15367-1:2003 are applicable to the testing and characterization of a wide range of beam types from both continuous wave and pulsed lasers. Definitions of parameters describing wavefront deformations are given together with methods for the determination of those parameters from phase distribution measurements.
PUBLISHED
ISO 15367-1:2003
90.93
Standard confirmed
Nov 27, 2020
ABANDON
ISO/NP 15367-1