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IEC TS 63342:2022 ED1

C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection IEC TS 63342:2022 ED1

Publication date:   Jul 20, 2022

General information

60.60 Standard published   Jul 20, 2022

IEC

TC 82

Technical Specification

27.160   Solar energy engineering

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Scope

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

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IEC TS 63342:2022 ED1
60.60 Standard published
Jul 20, 2022