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IEC TS 62876-3-4 ED1

Nanomanufacturing – Reliability assessment – Part 3-4: Linearity of output characteristics for metal contacted 2D semiconductor devices

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30.60 Close of voting/ comment period   Aug 9, 2024

IEC

TC 113

Technical Specification

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IEC TS 62876-3-4 ED1
30.60 Close of voting/ comment period
Aug 9, 2024