IEC TS 62804-1-1:2020 ED1

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1-1: Crystalline silicon - Delamination

Publication date:   Jan 10, 2020

General information

60.60 Standard published   Jan 10, 2020

IEC

TC 82

Technical Specification

27.160   Solar energy engineering

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Scope

IEC 62804-1-1:2020 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules-principally those with one or two glass faces. This document evaluates delamination attributable to current transfer between ground and the module cell circuit. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and other components within the PV module activated by the voltage potential. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.

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PUBLISHED
IEC TS 62804-1-1:2020 ED1
60.60 Standard published
Jan 10, 2020