IEC TS 62607-4-4:2016(E), which is a Technical Specification, provides a measurement method for thermal runaway quality level test for nano-enabled energy storage devices. This method uses comparative measurement to enable a manufacturer to decide whether or not the nanomaterial additives used in energy storage devices are resilient against the thermal runaway caused by a faulty or accidental low resistance connection between two or several internal points depending on the number of stacking electrode layers of the test sample. The nanomaterial additives may mix with the materials of positive and negative electrodes, electrolyte, coated on electrodes or separator. This document includes definitions of terminology, test sample, puncture nail requirements, test procedures, data analysis and methods of interpretation of results and a case study. This document does not apply directly to the safety testing for energy storage device products due to complex safety design schemes embedded in these products.
PUBLISHED
IEC TS 62607-4-4:2016 ED1
60.60
Standard published
Oct 24, 2016