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IEC TS 62396-5:2008 ED1

Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems IEC TS 62396-5:2008 ED1

Publication date:   Aug 19, 2008

General information

99.60 Withdrawal effective   Aug 22, 2014

IEC

TC 107

Technical Specification

03.100.50   Production. Production management | 31.020   Electronic components in general | 49.060   Aerospace electric equipment and systems

Buying

Replaced

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Scope

IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62396-5:2007 ED1

NOW

WITHDRAWN
IEC TS 62396-5:2008 ED1
99.60 Withdrawal effective
Aug 22, 2014

REVISED BY

PUBLISHED
IEC 62396-5:2014 ED1