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IEC TR 62380:2004 ED1

Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment IEC TR 62380:2004 ED1

Publication date:   Aug 17, 2004

General information

99.60 Withdrawal effective   Sep 12, 2017

IEC

TC 56

Technical Report

21.020   Characteristics and design of machines, apparatus, equipment | 31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

Provides elements to calculate the failure rate of mounted electronic components. It makes equipment reliability optimization studies easier to carry out, thanks to the introduction of influence factors.

Life cycle

NOW

WITHDRAWN
IEC TR 62380:2004 ED1
99.60 Withdrawal effective
Sep 12, 2017

REVISED BY

PUBLISHED
IEC 61709:2017 ED3