99.60 Withdrawal effective Aug 28, 2015
IEC
Technical Report
31.200 Integrated circuits. Microelectronics
Revised
IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by simulation software. It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application. The exchange format can be applied to emission, immunity and impulse immunity near-field scan data in the frequency and time domains. The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.
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WITHDRAWN
IEC TR 61967-1-1:2010 ED1
99.60
Withdrawal effective
Aug 28, 2015
PUBLISHED
IEC TR 61967-1-1:2015 ED2