IEC PAS 62203:2000 ED1

Name: IEC PAS 62203:2000 ED1
Brand: IEC
SKU: IEC PAS 62203:2000 ED1
Price: 24.2 EUR
Availability: InStock
Rating: 5 (87 reviews)

Guide for the standard probe pad sizes and layouts for wafer-level electrical testing

Publication date: Nov 28, 2000

95.99 Withdrawal of Standard May 17, 2004

General information

Current stage: 95.99 Withdrawal of Standard May 17, 2004

Originator: IEC

Owner: TC 47

Type: Publicly Available Specification

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Withdrawn

PDF - €24.20

Languages: English

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Scope

Applies to double- and single-column arrays of metal probe pads, on a semiconductor wafer or chip, that are electrically connected to one or more test structures.

Life cycle

NOW

WITHDRAWN
IEC PAS 62203:2000 ED1
95.99 Withdrawal of Standard
May 17, 2004