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IEC PAS 62165:2000 ED1

Guidelines for the measurement of thermal resistance of GaAs FETs IEC PAS 62165:2000 ED1

Publication date:   Aug 22, 2000

95.99   Withdrawal of Standard   May 17, 2004

General information

95.99   Withdrawal of Standard   May 17, 2004

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

For power GaAs FET applications requiring high reliability an accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FET's operating temperature so that more accurate life estimates can be made. FET failure mechanism and failure rates have in general, an exponential dependence on temperature.

Life cycle

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WITHDRAWN
IEC PAS 62165:2000 ED1
95.99 Withdrawal of Standard
May 17, 2004




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