IEC 63505 ED1

Guidelines for measuring the threshold voltage (V<sub>T</sub>) of SiC MOSFETs

General information

50.00 Final text received or FDIS registered for formal approval   Sep 23, 2024

CFDIS    Dec 16, 2024

IEC

TC 47

International Standard

Life cycle

NOW

IN_DEVELOPMENT
IEC 63505 ED1
50.00 Final text received or FDIS registered for formal approval
Sep 23, 2024