IEC 63505 ED1

Guidelines for measuring the threshold voltage (VT) of SiC MOSFETs IEC 63505 ED1

Current stage: 40.99 Full report circulated: DIS approved for registration as FDIS Aug 16, 2024

Next stage: DECFDIS Next stage date : May 30, 2025

Originator: IEC

Owner: TC 47

Type: International Standard

IN_DEVELOPMENT
IEC 63505 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
Aug 16, 2024