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IEC 63378-6:2026 ED1

Thermal standardization on semiconductor packages - Part 6: Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points IEC 63378-6:2026 ED1

Publication date:   Feb 4, 2026

General information

60.60   Standard published   Feb 4, 2026

IEC

TC 47/SC 47D

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 63378-6:2026 specifies a thermal resistance and capacitance model for semiconductor packages. This model is named the digital transformation using thermal resistance and capacitance (DXRC) model. It predicts transient temperature at junction and measurement points.
This document applies to semiconductor packages such as TO-252, TO-263, and HSOP. It supports single chip packages dissipated heat from single package surface.

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IEC 63378-6:2026 ED1
60.60 Standard published
Feb 4, 2026




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