IEC 63287-3:2026 ED1

Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module IEC 63287-3:2026 ED1

Publication date:   Aug 6, 2026

General information

60.60   Standard published   Aug 6, 2026

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 63287-3:2026 specifies guidelines for a reliability qualification plan for power semiconductor modules to assure reliability targets over the entire product life.
Power semiconductor modules with incorporated control circuits are excluded. Clamped packages that need external pressure for being mounted in a system are excluded, e.g. disc-type pressure pack devices.
This document is not intended for medical, military, aeronautics and astronautics-related applications.
NOTE Throughout the document, the term power semiconductor module refers to multichip semiconductor power modules as defined in IEC 60191-4.

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PUBLISHED
IEC 63287-3:2026 ED1
60.60 Standard published
Aug 6, 2026




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