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IEC 63287-2:2023 ED1

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Publication date:   Mar 29, 2023

General information

60.60   Standard published   Mar 29, 2023

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

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PUBLISHED
IEC 63287-2:2023 ED1
60.60 Standard published
Mar 29, 2023