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IEC 63003:2015 ED1

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™

Publication date:   Dec 14, 2015

General information

60.60   Standard published   Dec 14, 2015

IEEE

TC 91

International Standard

25.040.01   Industrial automation systems in general

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  English  



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Scope

IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Life cycle

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PUBLISHED
IEC 63003:2015 ED1
60.60 Standard published
Dec 14, 2015